FEI Company has been rated by semiconductor companies around the world as one of the ten best providers of process diagnostics equipment, for the second consecutive year. Among companies engaged in providing high-resolution scanning and transmission electron microscopy systems (SEMs/TEMs), FEI ranked #1 in 2006, according to the annual customer satisfaction survey by the industry research firm VLSI Research Inc.

VLSI Research’s 2006 survey was distributed to 44,130 individuals world wide and received responses from customers representing 95% of the total semiconductor market.

FEI is a global leader in providing ultra-high resolution scanning and transmission electron microscopes, focused ion beam (FIB) and DualBeam™ (FIB/SEM) systems for both semiconductor lab and fab environments. The company’s systems are also utilised by leading data storage device and micro-electro mechanical systems (MEMS) companies. The systems are used to image, analyse and manipulate minute structures, which speed the correction of defects so customers can accelerate their time to market and high-profit volume production.

“It’s clear that FEI’s equipment is delivering excellent performance for process diagnostics,” commented G. Dan Hutcheson of VLSI Research. “Respondents ranked FEI highly in the areas of quality of results, field engineering support, product performance, process support and build quality.”

“It is an honour to once again be named as a 10 BEST Supplier for the semiconductor manufacturing industry,” said Paul O’Mara, FEI’s senior vice president of worldwide service. “With a strong focus on the needs of our semiconductor customers and tools that deliver ultra-high resolution and fast time to data, we believe that we will continue to deliver solutions that enable their progress through very challenging technology roadmaps.”

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