2008-12-02: PROVE™ System Ordered
NuFlare Orders Next Generation Photomask Registration and Overlay Metrology System
2008-11-21: Carl Zeiss Sets New World Record in Microscopy Resolution Using Scanning Helium Ions
2008-11-09 to 2008-11-12: 1st Asia Pacific EFTEM Workshop
Not more than 200kV, not less than an energy filter
