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 Browse hundreds of standard,
specialty, & custom AFM probes |
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 Introducing the world's first all-diamond AFM probes from Advanced Diamond Technologies
Learn More |
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 High speed, high-res optical profilometry.
Measure nanoscale roughness in seconds
Trimos TR Scan |
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 We've just added a
new line of AFM
probes and unique nanosensing tools
by Nascatec GmbH
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We provide tools with the speed, ease of use, and tight tolerances required by industrial applications
• 3D surface metrology instrumentation
• ISO standard data analysis software w/ batch reporting
• Specialty AFM probes - deep trench, sidewall,
critical dimension, extended life and more |
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We provide flexible instrumentation and accessories to expand your current research capabilities
• Modular Atomic Force Microscopy (AFM) systems
• Accessories for your current AFM systems
• Flexible & programmable data analysis software
• Thiol surface chemistry |
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Ease-of-use, mobility & affordable pricing allows you to easily set up teaching labs & outreach programs
• Easy to use, portable AFMs & STMs
• Nanoscience Curriculum
• Books
• Software |
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Nanoscience Instruments, Inc. | 9831 S. 51st Street, Suite C119 | Phoenix, AZ 85044 USA | tel: 480-940-3940, 888-777-5573 | f: 480-940-3941 |
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